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A Modified Mean Atomic Number Background Correction Using Off-Peak Interpolated Measurements

Published online by Cambridge University Press:  30 July 2020

Omero Orlandini ,
John Donovan  and
Benjamin Hanson
Omero Orlandini
Affiliation:
University of Texas at Austin, Austin, Texas, United States
John Donovan
Affiliation:
University of Oregon, Eugene, Oregon, United States
Benjamin Hanson
Affiliation:
Corning Research and Development Corp., Corning, New York, United States

Abstract

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Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 508 - 509
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Copyright
Copyright © Microscopy Society of America 2020

References

Donovan, JJ and Tingle, T, Journal of Microscopy and Microanalysis 2 (1996) p. 1.10.1017/S1431927696210013CrossRefGoogle Scholar
Donovan, JJ, Singer, JW and Armstrong, JT (2016) “A New EPMA Method for Fast Trace Element Analysis in Simple Matrices”, American Mineralogist, v101, p1839–185310.2138/am-2016-5628CrossRefGoogle Scholar