Hostname: page-component-7479d7b7d-pfhbr Total loading time: 0 Render date: 2024-07-11T02:49:31.414Z Has data issue: false hasContentIssue false
  • English
  • Français

Modeling and Measurements of Electron Beam Scattering into Adjacent Particles

Published online by Cambridge University Press:  26 July 2009

S Wight  and
J Small
S Wight
Affiliation:
National Insitute of Standards and Technology
J Small
Affiliation:
National Insitute of Standards and Technology

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1266 - 1267
Copyright
Copyright © Microscopy Society of America 2009