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Methods for Simulation of Electron Energy Loss Spectra for Low Energy Edges in Battery Materials

Published online by Cambridge University Press:  01 August 2018

Quentin Stoyel ,
Frederic Voisard ,
Nicolas Brodusch ,
George Demopoulos  and
Raynald Gauvin
Quentin Stoyel
Affiliation:
Mining and Material Engineering, McGill University, Montreal, Canada.
Frederic Voisard
Affiliation:
Mining and Material Engineering, McGill University, Montreal, Canada.
Nicolas Brodusch
Affiliation:
Mining and Material Engineering, McGill University, Montreal, Canada.
George Demopoulos
Affiliation:
Mining and Material Engineering, McGill University, Montreal, Canada.
Raynald Gauvin
Affiliation:
Mining and Material Engineering, McGill University, Montreal, Canada.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 440 - 441
Copyright
© Microscopy Society of America 2018 

References

[1] Hebert, C. Micron 38(1 2007) p. 12.Google Scholar
[2] Mauchamp, V., et al, Phys. Rev. B 74(11 2006) p. 115106.Google Scholar
[3] Mizoguchi, T., et al, Ultramicroscopy 180 2017) p. 93.Google Scholar
[4] Mauchamp, V., et al, Phys. Rev. B 77(4 2008) p. 045117.Google Scholar
[5] The authors acknowledge funding from McGill University, NSERC CGS, and IREQ.Google Scholar