Hostname: page-component-7479d7b7d-68ccn Total loading time: 0 Render date: 2024-07-12T09:21:38.083Z Has data issue: false hasContentIssue false
  • English
  • Français

A Method to Correct Elliptical Distortion of Diffraction Patterns in TEM

Published online by Cambridge University Press:  03 August 2008

VDH Hou  and
D Li
VDH Hou
Affiliation:
Micron Technology
D Li
Affiliation:
Micron Technology
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1126 - 1127
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)