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Mapping “Broken” Dark Modes Using Cathodoluminescence in a Scanning Electron Microscope

Published online by Cambridge University Press:  04 August 2017

A. C. Y. Liu ,
D. E. Gomez  and
T. Coenen
A. C. Y. Liu
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Clayton, Australia School of Physics and Astronomy, Monash University, Clayton, Australia
D. E. Gomez
Affiliation:
School of Applied Science, RMIT University, Melbourne, Australia
T. Coenen
Affiliation:
DELMIC BV, Thijsseweg 11, 2629 JA, Delft, The Netherlands

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1530 - 1531
Copyright
© Microscopy Society of America 2017 

References

[1] Chang, Y-C, et al, ACS Nano 6 2012). p. 3390.Google Scholar
[2] Gomez, D E, et al, Nano Lett 13 2013). p. 3722.CrossRefGoogle Scholar
[3] Coenen, T, et al, MRS Bull 40 2015). p. 359.CrossRefGoogle Scholar
[4] Kociak, M & Stephan, O Chem Soc Rev 43 2014). p. 3865.Google Scholar
[5] The authors acknowledge the use of facilities in the Monash Centre for Electron Microscopy (ARC LE140100104). We thank Joanne Etheridge, Albert Polman and Tim Davis for many stimulating discussions. This work was performed in part at the Melbourne Centre for Nanofabrication (MCN) in the Victorian Node of the Australian National Fabrication Facility (ANFF). D.E.G. acknowledges the ARC for support through a Future Fellowship (FT140100514) and the ANFF for the MCN Technology Fellowship.Google Scholar