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Making every electron count: materials characterization by quantitative analytical scanning transmission electron microscopy

Published online by Cambridge University Press:  25 July 2016

Matthew Weyland ,
Zhen Chen ,
Adrian J. D’Alfonso ,
Yuman Zhu ,
Nikhil V. Medhekar ,
Christian Dwyer ,
Daniel J. Taplin ,
Scott D. Findlay  and
Leslie J. Allen
Matthew Weyland
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Clayton, Victoria3800, Australia Department of Materials Science and Engineering, Monash University, Clayton, Victoria3800, Australia
Zhen Chen
Affiliation:
School of Physics and Astronomy, Monash University, Clayton, Victoria3800, Australia
Adrian J. D’Alfonso
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria3010, Australia
Yuman Zhu
Affiliation:
Department of Materials Science and Engineering, Monash University, Clayton, Victoria3800, Australia
Nikhil V. Medhekar
Affiliation:
Department of Materials Science and Engineering, Monash University, Clayton, Victoria3800, Australia
Christian Dwyer
Affiliation:
Department of Physics, Arizona State University, Tempe, Arizona85287, USA
Daniel J. Taplin
Affiliation:
School of Physics and Astronomy, Monash University, Clayton, Victoria3800, Australia
Scott D. Findlay
Affiliation:
School of Physics and Astronomy, Monash University, Clayton, Victoria3800, Australia
Leslie J. Allen
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria3010, Australia

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1430 - 1431
Copyright
© Microscopy Society of America 2016 

References

[1] LeBeau, JM, et al, PRL 100 (2008) 206101.CrossRefGoogle Scholar
[2] Dwyer, C, et al, APL 100 (2012) 191915.Google Scholar
[3] Zhu, Y, et al, Scripta Materialia 101 (2015). p. 16.CrossRefGoogle Scholar
[4] Chen, Z, et al, Ultramicroscopy 157 (2015). p. 21.CrossRefGoogle Scholar
[5] The authors wish to thank Ye Zhu (Monash), Nestor Zaluzec (Argonne) and Alan Sandbog (EDAX). This work was supported by the Australian Research Council (Projects DP110102228, DP140102538, DE130100739 and LE0454166) and the Monash Centre for Electron Microscopy.Google Scholar