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Low Voltage Nanotip Interferometry

Published online by Cambridge University Press:  01 August 2002

A. Thesen ,
B.G. Frost  and
D.C. Joy
A. Thesen
Affiliation:
EM Facility, University of Tennessee, Knoxville, TN 37996 and High Temperatures Materials Laboratory, Oak Ridge National Laboratory, Bethel Valley Road 1, Oak Ridge, TN 37831
B.G. Frost
Affiliation:
EM Facility, University of Tennessee, Knoxville, TN 37996 and High Temperatures Materials Laboratory, Oak Ridge National Laboratory, Bethel Valley Road 1, Oak Ridge, TN 37831
D.C. Joy
Affiliation:
EM Facility, University of Tennessee, Knoxville, TN 37996 and High Temperatures Materials Laboratory, Oak Ridge National Laboratory, Bethel Valley Road 1, Oak Ridge, TN 37831

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 520 - 521
Copyright
Copyright © Microscopy Society of America 2002