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Low Voltage Imaging of Carbon Nanotubes With Tin-Palladium Particles Using STEM Detector in a FE-SEM

Published online by Cambridge University Press:  31 July 2006

C Probst ,
R Gauvin  and
RA L Drew
C Probst
Affiliation:
McGill University
R Gauvin
Affiliation:
McGill University
RA L Drew
Affiliation:
McGill University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1440 - 1441
Copyright
© 2006 Microscopy Society of America