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Local Lattice Strain Measurement using Geometric Phase Analysis of Annular Dark Field Images from Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2010

J Chung ,
G Lian  and
L Rabenberg
J Chung
Affiliation:
Texas Instruments
G Lian
Affiliation:
Texas Instruments
L Rabenberg
Affiliation:
The University of Texas, Austin

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1476 - 1477
Copyright
Copyright © Microscopy Society of America 2010