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Limits of Specimen Thickness for Energy-Filtered Tomography of Stained Plastic Sections at 120 kV Beam Voltage

Published online by Cambridge University Press:  01 August 2002

E. Kocsis ,
A. Weisberg ,
B. Moss ,
X. Chen ,
T.S. Reese  and
R.D. Leapman
E. Kocsis
Affiliation:
Division of Bioengineering and Physical Science, ORS, National Institutes of Health, Bethesda, MD 20892
A. Weisberg
Affiliation:
Laboratory of Viral Diseases, NIAID, National Institutes of Health, Bethesda, MD 20892
B. Moss
Affiliation:
Laboratory of Viral Diseases, NIAID, National Institutes of Health, Bethesda, MD 20892
X. Chen
Affiliation:
Laboratory of Neurobiology, NINDS, National Institutes of Health, Bethesda, MD 20892
T.S. Reese
Affiliation:
Laboratory of Neurobiology, NINDS, National Institutes of Health, Bethesda, MD 20892
R.D. Leapman
Affiliation:
Division of Bioengineering and Physical Science, ORS, National Institutes of Health, Bethesda, MD 20892

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 882 - 883
Copyright
Copyright © Microscopy Society of America 2002