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IPrep – Automated Serial-Section Broad-Ion-Beam Tomography

Published online by Cambridge University Press:  25 July 2016

T. Hosman ,
S. Coyle ,
A. Abbott ,
M. Olvera ,
M. Hassel-Shearer  and
J.A. Hunt
T. Hosman
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
S. Coyle
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
A. Abbott
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
M. Olvera
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
M. Hassel-Shearer
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA
J.A. Hunt
Affiliation:
Gatan Inc., 5794 W. Las Positas Blvd., Pleasanton, CA 94588USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 590 - 591
Copyright
© Microscopy Society of America 2016 

References

[1] Winiarski, , et al.. (2016). Broad Ion Beam Serial Section Tomography. Manuscript in preparation.Google Scholar
[2] Burnett, , et al.. (2016). Large volume serial section tomography by Xe Plasma FIB dual beam microscopy. Ultramicroscopy 161, 119–129.CrossRefGoogle ScholarPubMed
[3] Gholinia, , et al.,2016). Automated three dimensional broad ion beam milling acquisition and analysis. To be presented at Royal Microscopy Society-EBSD, Manchester, U.K. [4] The authors thank Philip J. Withers, Ali Gholinia and their colleagues at The University of Manchester School of Materials for their collaboration prior to and during the development of IPrep II.Google Scholar