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Ion Beam Sputtering for Controlled Synthesis of Thin MAX (MXene) Phases

Published online by Cambridge University Press:  05 August 2019

Pavel Horak
Affiliation:
Nuclear Physics Institute (NPI) of the Czech Academy of Sciences (CAS), 205 68, Czech Republic.
Jiri Vacik*
Affiliation:
Nuclear Physics Institute (NPI) of the Czech Academy of Sciences (CAS), 205 68, Czech Republic.
Snejana Bakardjieva
Affiliation:
Institute of Inorganic Chemistry of the Czech Academy of Sciences, 205 68 Rez, Czech Republic.
Antonino Cannavo
Affiliation:
Nuclear Physics Institute (NPI) of the Czech Academy of Sciences (CAS), 205 68, Czech Republic.
Giovanni Ceccio
Affiliation:
Nuclear Physics Institute (NPI) of the Czech Academy of Sciences (CAS), 205 68, Czech Republic.
Jaroslav Kupcik
Affiliation:
Institute of Inorganic Chemistry of the Czech Academy of Sciences, 205 68 Rez, Czech Republic.
Robert Klie
Affiliation:
University of Illinois at Chicago, Department of Physics, 845 W Taylor Str., 60 607 Chicago, USA.
*
*Corresponding author: vacik@ujf.cas.cz

Abstract

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Type
Microscopy and Microanalysis of Nuclear and Irradiated Materials
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]http://canam.ujf.cas.cz (accessed 02, 22, 2019).Google Scholar
[2]Eklund, P, Beckers, M, Jansson, U, Högberg, H, Hultman, L, Thin Solid Films 518 (2010), p. 1851.Google Scholar
[3]Naguib, M, Mochalin, V, Barsoum, M, Gogotsi, Y, Advanced Materials 26 (2011), p. 992.Google Scholar
[4]Tallman, D, “On the Potential of MAX phases for Nuclear Applications”, Thesis, Drexel Univ., 2015.Google Scholar
[5]The authors acknowledge funding from the MEYS, Czech Republic, Project LTAUSA 17128.Google Scholar