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Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Published online by Cambridge University Press:  27 August 2014

Veronika Novotna ,
Kamila Hrubanova ,
Jana Nebesarova  and
Vladislav Krzyzanek
Veronika Novotna
Affiliation:
Institute of Scientific Instrument ASCR, Department of Electron Microscopy, Brno, Czech Republic Brno University of Technology, Department of Biomedical Engineering, Brno, Czech Republic
Kamila Hrubanova
Affiliation:
Institute of Scientific Instrument ASCR, Department of Electron Microscopy, Brno, Czech Republic Brno University of Technology, Institute of Physical Engineering, Brno, Czech Republic
Jana Nebesarova
Affiliation:
Biology center ASCR, Institute of Parasitology, Ceske Budejovice, Czech Republic
Vladislav Krzyzanek
Affiliation:
Institute of Scientific Instrument ASCR, Department of Electron Microscopy, Brno, Czech Republic

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1270 - 1271
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Crewe, AV, Wall, J and Langmore, J Science 168 (1970) p. 1338.Google Scholar
[2] Bogner, A, et al , Micron 38 (2007) p. 390.Google Scholar
[3] Browning, ND, et al , in “The Application of Scanning Transmission Electron Microscopy (STEM) to the Study of Nanoscale Systems” (Springer (2012) p. 11.Google Scholar
[4] The authors acknowledge the support by the grants CZ.1.07/2.3.00/20.0103 and LO1212 (EC and MEYS CR), 14-20012S (GACR) and TE01020118 (TACR).Google Scholar