Hostname: page-component-7479d7b7d-rvbq7 Total loading time: 0 Render date: 2024-07-12T05:12:17.482Z Has data issue: false hasContentIssue false
  • English
  • Français

Investigation of Dielectric Breakdown on the Atomic Length-Scale Using In Situ STM-TEM

Published online by Cambridge University Press:  01 August 2010

K van Benthem ,
CS Bonifacio ,
AM Thron ,
SM Weil  and
TB Holland
K van Benthem
Affiliation:
University of California, Davis
CS Bonifacio
Affiliation:
University of California, Davis
AM Thron
Affiliation:
University of California, Davis
SM Weil
Affiliation:
University of California, Davis
TB Holland
Affiliation:
University of California, Davis

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1750 - 1751
Copyright
Copyright © Microscopy Society of America 2010