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Interpreting Voids in Atom Probe Tomography Data via Experiment and Theory

Published online by Cambridge University Press:  05 August 2019

Jonathan D. Poplawsky ,
Xing Wang ,
Constantinos Hatzouglou ,
Wei Guo ,
Ke Jin ,
Hongbin Bei ,
Yongqiang Wang ,
William J. Weber ,
Yanwen Zhang  and
Francois Vurpillot
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Jonathan D. Poplawsky*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Xing Wang
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Constantinos Hatzouglou
Affiliation:
Normandie Université, UNIROUEN, INSA Rouen, CNRS, GPM, Rouen, France.
Wei Guo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Ke Jin
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Hongbin Bei
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Yongqiang Wang
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM, USA.
William J. Weber
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA. Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA.
Yanwen Zhang
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA. Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA.
Francois Vurpillot
Affiliation:
Normandie Université, UNIROUEN, INSA Rouen, CNRS, GPM, Rouen, France.
Karren L. More
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
*
*Corresponding author: poplawskyjd@ornl.gov

Abstract

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Type
Recent Developments in Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 290 - 291
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Devaraj, A et al. , Scientific Reports 6 (2016), p. 37586.Google Scholar
[2]Edmondson, PD et al. , Scripta Materialia 65 (2011), p. 731.Google Scholar
[3]Schmidt, J et al. , Angewandte Chemie International Edition 57 (2018), p. 10422.Google Scholar
[4]Miller, MK et al. , Ultramicroscopy 111 (2011), p. 469.Google Scholar
[5]This work was supported as part of the Energy Dissipation to Defect Evolution (EDDE), an Energy Frontier Research Center funded by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences under contract number DE-AC05-00OR22725. APT and STEM performed at ORNL's Center for Nanophase Materials Sciences, which is a U.S. DOE, Office of Science User Facility. Helium implantations were supported by the Center for Integrated Nanotechnologies (CINT), a DOE Office of Science User Facility jointly operated by Los Alamos and Sandia National Laboratories. This manuscript has been authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).Google Scholar