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Interfacial Segregation Studied With Modern AEM Techniques

Published online by Cambridge University Press:  02 July 2020

J. Bentley
J. Bentley*
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN37831-6376
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Extract

For more than 20 years interfacial segregation has been studied by analytical electron microscopy (AEM). Two recent commercial developments should allow more widespread application of 1 nm resolution AEM studies of interfacial segregation. The first is a system for integrated acquisition that in its most sophisticated form allows spectrum imaging [a full spectrum recorded at every pixel of an image (e.g. STEM)] for simultaneous multiple spectroscopies (e.g., EDS and PEELS). A field emission gun (FEG) is necessary for sufficient sensitivity at high spatial resolution. The second commercial development has been imaging energy filters that allow the production of elemental maps from a series of energy-filtered TEM (EFTEM) images at inner shell ionization edges. Resolutions of ∼1 nm can be achieved without an FEG, but analysis is limited to the electron energy-loss signal. Although complex microstructures may require full two-dimensional mapping, for many planar interfaces a one-dimensional profile of composition or chemistry normal to the interface plane is sufficient.

Type
Segregation and Diffusion Analysis in Materials
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 533 - 534
Copyright
Copyright © Microscopy Society of America 1997

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References

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7 Research at the ORNL SHaRE User Facility sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp. Thanks to my collaborators: Ed Kenik, Ernie Hall (GE), and Matt Libera (Stevens Inst. Technol.).Google Scholar