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In-Situ Characterization of 2D Potential Distributions in Biased Si n+-p Junctions Using Off-Axis Electron Holography

Published online by Cambridge University Press:  03 August 2008

M Han ,
T Hirayama ,
DJ Smith  and
MR McCartney
M Han
Affiliation:
The Japan Fine Ceramics Center, Japan
T Hirayama
Affiliation:
The Japan Fine Ceramics Center, Japan
DJ Smith
Affiliation:
Arizona State University
MR McCartney
Affiliation:
Arizona State University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 400 - 401
Copyright
© 2008 Microscopy Society of America

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