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Increased Sample Yield and Achievable Imaging Resolutions Through Thin Film Transfer Technique

Published online by Cambridge University Press:  01 August 2018

Otto Zietz ,
Sam Olson ,
Brendan Coyne  and
Jun Jiao
Otto Zietz
Affiliation:
Department of Mechanical and Materials Engineering, Portland State University, Portland, OR.
Sam Olson
Affiliation:
Department of Mechanical and Materials Engineering, Portland State University, Portland, OR.
Brendan Coyne
Affiliation:
Department of Mechanical and Materials Engineering, Portland State University, Portland, OR.
Jun Jiao
Affiliation:
Department of Mechanical and Materials Engineering, Portland State University, Portland, OR.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1630 - 1631
Copyright
© Microscopy Society of America 2018 

References

[1] Cho, J, Cullinan, M Micro Nano-Manuf, ASME J. 6 2017) p. 024501.Google Scholar
[2] Wang, Y, Zheng, Y Xu, X ACS Nano 5 2011) p. 9927.Google Scholar
[3] The authors would like to thank Intel, NSF, and the Oregon Metals Initiative.Google Scholar