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In SituHigh-Resolution Electron Spectroscopic Imaging and Real-Time Image Simulation of Precipitate Growth Mechanisms

Published online by Cambridge University Press:  02 July 2020

J. M. Howe
Affiliation:
Department of Materials Science & Engineering, University of Virginia, Charlottesville, VA22903
M. M. Tsai
Affiliation:
Department of Materials Science & Engineering, University of Virginia, Charlottesville, VA22903
A. A. Csontos
Affiliation:
Department of Materials Science & Engineering, University of Virginia, Charlottesville, VA22903
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Extract

Precipitate interfaces are ideal for studying the relationship between atomic bonding, structure and composition at internal interfaces and the mechanisms and kinetics of their motion as a function of temperature or driving force for reaction. The crystallography between coherent and semicoherent precipitates and the matrix is well-defined and the precipitate interfaces are often planar and grow by a terrace-ledge-kink mechanism, making them well-suited for study by conventional and high-resolution transmission electron microscopy (HRTEM).

Motion of precipitate interfaces, or more generally, interphase boundaries, involves a change in lattice, composition or both. In order to understand the mechansims of interfacial motion, it is necessary to determine the structural and compositional changes that occur at the highest possible resolution, i.e., as close to the atomic level as possible, and also, to determine the corresponding kinetics of interface motion. HRTEM is an excellent technique for determining the atomic structure of transformation interfaces and in situhot-stage HRTEM is deal for determining interface dynamics at the atomic level, provided the transformation mechanisms are not altered by the thinness of the TEM foil.

Type
Atomic Structure and Mechanisms at Interfaces In Materials
Copyright
Copyright © Microscopy Society of America 1997

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References

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This research was supported by the National Science Foundation under Grant DMR-9630092.Google Scholar