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In Situ Uhv-Tem Oxidation And Reduction Of Metals

Published online by Cambridge University Press:  02 July 2020

M Yeadon
Affiliation:
institute of Materials Research and Engineering, National University of Singapore, Singapore119260
B. Kolasa
Affiliation:
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL61801
J. M. Gibson
Affiliation:
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL61801
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Extract

In this proceedings, we present a review of our experimental results of our investigations of the mechanisms of the initial stages of copper oxidation. We examined the initial stages of Cu(001) oxidation and reduction by in situ ultra-high vacuum (UHV) transmission, electron microscopy (TEM). We observed surface reconstruction and nucleation and growth of copper oxide islands. We have examined the oxidation processes from oxygen partial pressures of 10-5 torr to atmospheric pressures and temperatures from 25°C to 600°C, in order to gain fundamental insights into this important gas-metal reaction.

Fundamental knowledge of gas-metal reactions, in particular oxidation, is important for a wide variety of materials science fields, such as dry corrosion, catalysis, as well as some thin film growth, such as ferroelectrics. However, there is a wide gap between information provided by surface science methods and that provided by bulk oxidation studies. The former have mostly examined the adsorption of up to ˜1ML of oxygen on the metal surface.

Type
Atomic Structure And Microchemistry Of Interfaces
Copyright
Copyright © Microscopy Society of America

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References

References:

1McDonald, M. L., Gibson, J. M., and Unterwald, F. C., Rev. Sci. Instrum. 60 (1989),700707 .CrossRefGoogle Scholar
2Yang, J. C.,Yeadon, M., Kolasa, B., and Gibson, J.M., Scripta Materialia 38, (1998), 12371242 .CrossRefGoogle Scholar
3Yang, J. C., Yeadon, M., Kolasa, B., and Gibson, J.M., App. Phys. Lett. 70, (1997), 35223524CrossRefGoogle Scholar
4Cabrera, N. and Mott, N. F., Reports on Progress in Physics 12, (1948), 163184.CrossRefGoogle Scholar
5Yang, J. C., Yeadon, M., Kolasa, B., and Gibson, J.M., App. Phys. Lett. 73, (1998), 28412843.CrossRefGoogle Scholar
6This research project is funded by the Department of Energy (DEFG02-96ER45439). We thank M. Menezes, H. Birnbaum and M. Marshall for their assistance.Google Scholar