Hostname: page-component-848d4c4894-wzw2p Total loading time: 0 Render date: 2024-05-21T11:31:35.860Z Has data issue: false hasContentIssue false

In situ Transmission Electron Microscopy Annealing for Crystallization and Phase Stability Studies in the Ga2O3-In2O3 System

Published online by Cambridge University Press:  05 August 2019

Charlotte Wouters*
Affiliation:
Leibniz-Institut für Kristallzüchtung, Berlin, Germany.
Toni Markurt
Affiliation:
Leibniz-Institut für Kristallzüchtung, Berlin, Germany.
Oliver Bierwagen
Affiliation:
Paul-Drude-Institut für Festkörperelektronik, Berlin, Germany.
Christopher Sutton
Affiliation:
Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin, Germany.
Martin Albrecht
Affiliation:
Leibniz-Institut für Kristallzüchtung, Berlin, Germany.
*
*Corresponding author: charlotte.wouters@ikz-berlin.de

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Higashiwaki, et al. , Appl. Phys. Lett. 100 (2012), p. 013504.Google Scholar
[2]Chabak, et al. , Appl. Phys. Lett. 109 (2016), p. 213501.Google Scholar
[3]Wenckstern, et al. , Semicond. Sci. Technol. 30 (2015), p. 024005.Google Scholar
[4]Shannon, and Prewitt, , J. inorg. nucl. Chem. 30 (1968), p. 1389.Google Scholar
[5]Peelaers, et al. , Phys Rev B 92 (2015), p. 085206.Google Scholar
[6]Maccioni, et al. , Appl. Phys. Express 9 (2016), p. 041102.Google Scholar