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In situ TEM tensile tests of nanoscale Mg samples oriented for basal slip

Published online by Cambridge University Press:  23 November 2012

Q. Yu ,
A. Minor ,
L. Qi ,
J. Li  and
R. Mishra
Q. Yu
Affiliation:
UC Berkeley and National Center for Electron Microscopy, Lawrence Berkeley National Laborator, Berkeley, CA
A. Minor
Affiliation:
UC Berkeley and National Center for Electron Microscopy, Lawrence Berkeley National Laborator, Berkeley, CA
L. Qi
Affiliation:
Department of Nuclear Science and Engineering & Department of Materials Science and Engineering, Massachusetts Institute of Technology, Boston, MA
J. Li
Affiliation:
Department of Nuclear Science and Engineering & Department of Materials Science and Engineering, Massachusetts Institute of Technology, Boston, MA
R. Mishra
Affiliation:
General Motors Research and Development Center, Warren, MI
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 738 - 739
Copyright
Copyright © Microscopy Society of America 2012

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