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Microscopy and Microanalysis Microscopy and Microanalysis

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In Situ TEM Probing of Ferroelectric Switching under Electrical Bias

Published online by Cambridge University Press:  01 August 2018

Xiaoqing Pan ,
Lin-Ze Li ,
Mingjie Xu ,
Sheng Dai  and
Thomas Blum
Xiaoqing Pan
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA Department of Physics and Astronomy, University of California - Irvine, Irvine, CA
Lin-Ze Li
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA
Mingjie Xu
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA
Sheng Dai
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA
Thomas Blum
Affiliation:
Department of Physics and Astronomy, University of California - Irvine, Irvine, CA
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Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1812 - 1813
Copyright
© Microscopy Society of America 2018 

References

[1] Li, L.Z., et al, Nano Lett. 17 2017) p. 3556.CrossRefGoogle Scholar
[2] The author gratefully acknowledges the financial support by the DOE under grant DE-SC0014430.Google Scholar
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