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In situ Scanning Transmission Electron Microscopy with Atomic Resolution under Atmospheric Pressures

Published online by Cambridge University Press:  01 August 2018

Sheng Dai
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA, USA
Shuyi Zhang
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA, USA
George. W. Graham
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA, USA
Xiaoqing Pan
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA, USA Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Avanesian, T, et al., J. Am. Chem. Soc. 139 2017) p. 4551.Google Scholar
[2] Dai, S, et al, Nat. Commun. 8 2017) p. 204.Google Scholar
[3] Dai, S, et al., Nano Lett. 17 2017) p. 4683.Google Scholar
[4] Dai, S, et al., ACS Catal. 7 2017) p. 1579.Google Scholar