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In situ Probing of Nanostructure Surfaces

Published online by Cambridge University Press:  05 August 2019

Thomas W. Hansen*
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark.
Monia R. Nielsen
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark.
Pei Liu
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark.
Philomena Schlexer
Affiliation:
Department of Chemical Engineering, Stanford University, Stanford, CA, USA.
Jacob Madsen
Affiliation:
DTU Physics, Technical University of Denmark, Kgs. Lyngby, Denmark.
Anton B. Andersen
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark.
Jakob Schiøtz
Affiliation:
DTU Physics, Technical University of Denmark, Kgs. Lyngby, Denmark.
Bela Sebok
Affiliation:
DTU Physics, Technical University of Denmark, Kgs. Lyngby, Denmark.
Ib Chorkendorff
Affiliation:
DTU Physics, Technical University of Denmark, Kgs. Lyngby, Denmark.
Jakob B. Wagner
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark.
*
*Corresponding author: thwh@dtu.dk
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Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Hansen, TW, Wagner, JB, Eds., “Controlled Atmosphere Transmission Electron Microscopy”, (Springer) p. 329.Google Scholar
[2]Schlexer, P et al. , Part. Part. Syst. Charact. (2019).Google Scholar
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