Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-26T14:26:11.982Z Has data issue: false hasContentIssue false
  • English
  • Français

In Situ Measurement of Elastic and Frictional Properties Using Atomic Force Microscopy

Published online by Cambridge University Press:  28 September 2021

Ngoc-Phat Huynh ,
Tuan-Em Le  and
Koo-Hyun Chung Open the ORCID record for Koo-Hyun Chung [Opens in a new window]
Ngoc-Phat Huynh
Affiliation:
School of Mechanical Engineering, University of Ulsan, 93 Daehak-ro, Nam-gu, Ulsan 44610, Republic of Korea
Tuan-Em Le
Affiliation:
School of Mechanical Engineering, University of Ulsan, 93 Daehak-ro, Nam-gu, Ulsan 44610, Republic of Korea
Koo-Hyun Chung*
Affiliation:
School of Mechanical Engineering, University of Ulsan, 93 Daehak-ro, Nam-gu, Ulsan 44610, Republic of Korea
*
*Corresponding author: Koo-Hyun Chung, E-mail: khchung@ulsan.ac.kr
Get access

Abstract

Atomic force microscopy (AFM) can determine mechanical properties, associated with surface topography and structure, of a material at the nanoscale. Force–indentation curves that depict the deformation of a target specimen as a function of an applied force are widely used to determine the elastic modulus of a material based on a contact model. However, a hysteresis may arise due to friction between the AFM tip and a specimen. Consequently, the normal force detected using a photodetector during extension and retraction could be underestimated and overestimated, respectively, and the extension/retraction data could result in a significant difference in the elastic modulus measurement result. In this study, elastic modulus and friction coefficient values were determined based on an in situ theoretical model that compensated for the effect of friction on force–indentation data. It validated the proposed model using three different polymer specimens and colloidal-tipped probes for the force–indentation curve and friction loop measurements. This research could contribute to the accurate measurement of mechanical properties using AFM by enhancing the interpretation of force–indentation curves with friction-induced hysteresis. Furthermore, the proposed approach may be useful for analyzing in situ relationships between mechanical and frictional properties from a fundamental tribological perspective.

Keywords

atomic force microscopyelastic modulusfriction coefficientfriction-induced hysteresispolymers
Type
Software and Instrumentation
Information
Microscopy and Microanalysis , Volume 27 , Issue 6 , December 2021 , pp. 1488 - 1497
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

A-Hassan, E, Heinz, WF, Antonik, MD, D'Costa, NP, Nageswaran, S, Schoenenberger, CA & Hoh, JH (1998). Relative microelastic mapping of living cells by atomic force microscopy. Biophys J 74(3), 1564–1578.CrossRefGoogle ScholarPubMed
Attard, P, Carambassis, A & Rutland, MW (1999). Dynamic surface force measurement. 2. Friction and the atomic force microscope. Langmuir 15(2), 553–563.CrossRefGoogle Scholar
Binnig, G, Quate, CF & Gerber, C (1986). Atomic force microscope. Phys Rev Lett 56(9), 930–933.CrossRefGoogle ScholarPubMed
Cain, RG, Biggs, S & Page, NW (2000). Force calibration in lateral force microscopy. J Colloid Interface Sci 227(1), 55–65.CrossRefGoogle ScholarPubMed
Cannara, RJ, Brukman, MJ & Carpick, RW (2005). Cantilever tilt compensation for variable-load atomic force microscopy. Rev Sci Instrum 76(5), 053706.CrossRefGoogle Scholar
Cappella, B & Dietler, G (1999). Force-distance curves by atomic force microscopy. Surf Sci Rep 34(1–3), 1–104.CrossRefGoogle Scholar
Chung, KH, Lee, YH, Kim, HJ & Kim, DE (2013). Fundamental investigation of the wear progression of silicon atomic force microscope probes. Tribol Lett 52(2), 315–325.CrossRefGoogle Scholar
Chung, KH, Pratt, JR & Reitsma, MG (2010). Lateral force calibration: Accurate procedures for colloidal probe friction measurements in atomic force microscopy. Langmuir 26(2), 1386–1394.CrossRefGoogle ScholarPubMed
Chung, KH, Shaw, GA & Pratt, JR (2009). Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy. Rev Sci Instrum 80(6), 065107.CrossRefGoogle ScholarPubMed
Chyasnavichyus, M, Young, SL, Geryak, R & Tsukruk, VV (2016). Probing elastic properties of soft materials with AFM: Data analysis for different tip geometries. Polymer 102, 317–325.CrossRefGoogle Scholar
Coleman, TF & Li, Y (1994). On the convergence of interior-reflective newton methods for nonlinear minimization subject to bounds. Math Program 67(1), 189–224.CrossRefGoogle Scholar
Coleman, TF & Li, Y (1996). An interior trust region approach for nonlinear minimization subject to bounds. SIAM J Optim 6(2), 418–445.CrossRefGoogle Scholar
Dokukin, ME & Sokolov, I (2012). On the measurements of rigidity modulus of soft materials in nanoindentation experiments at small depth. Macromolecules 45(10), 4277–4288.CrossRefGoogle Scholar
Domke, J & Radmacher, M (1998). Measuring the elastic properties of thin polymer films with the atomic force microscope. Langmuir 14(12), 3320–3325.CrossRefGoogle Scholar
Hanson, MT & Johnson, T (1993). The elastic field for spherical Hertzian contact of isotropic bodies revisited: Some alternative expressions. J Tribol 115(2), 327–332.CrossRefGoogle Scholar
Heim, LO, Kappl, M & Butt, HJ (2004). Tilt of atomic force microscope cantilevers: Effect on spring constant and adhesion measurements. Langmuir 20(7), 2760–2764.CrossRefGoogle ScholarPubMed
Heim, LO, Rodrigues, TS & Bonaccurso, E (2014). Direct thermal noise calibration of colloidal probe cantilevers. Colloid Surf A 443, 377–383.CrossRefGoogle Scholar
Hoh, JH & Engel, A (1993). Friction effects on force measurements with an atomic force microscope. Langmuir 9(11), 3310–3312.CrossRefGoogle Scholar
Hutter, JL (2005). Comment on tilt of atomic force microscope cantilevers: Effect on spring constant and adhesion measurements. Langmuir 21(6), 2630–2632.CrossRefGoogle ScholarPubMed
Hutter, JL & Bechhoefer, J (1993). Calibration of atomic-force microscope tips. Rev Sci Instrum 64(7), 1868–1873.CrossRefGoogle Scholar
Jee, AY & Lee, M (2010). Comparative analysis on the nanoindentation of polymers using atomic force microscopy. Polym Test 29(1), 95–99.CrossRefGoogle Scholar
Johnson, KL, Kendall, K & Roberts, AD (1971). Surface energy and the contact of elastic solids. Proc R Soc Lond A Math Phys Sci 324(1558), 301–313.Google Scholar
Karhu, E, Gooyers, M & Hutter, JL (2009). Quantitative friction-force measurements by longitudinal atomic force microscope imaging. Langmuir 25(11), 6203–6213.CrossRefGoogle ScholarPubMed
Killgore, JP, Geiss, RH & Hurley, DC (2011). Continuous measurement of atomic force microscope tip wear by contact resonance force microscopy. Small 7(8), 1018–1022.CrossRefGoogle ScholarPubMed
Kim, HJ, Nguyen, GH, Ky, DLC, Tran, DK, Jeon, KJ & Chung, KH (2016). Static and kinetic friction characteristics of nanowire on different substrates. Appl Surf Sci 379, 452–461.CrossRefGoogle Scholar
Koinkar, VN & Bhushan, B (1996). Microtribological studies of unlubricated and lubricated surfaces using atomic force/friction force microscopy. J Vac Sci Technol A 14(4), 2378–2391.CrossRefGoogle Scholar
Liu, H, Bhushan, B, Eck, W & Stadler, V (2001). Investigation of the adhesion, friction, and wear properties of biphenyl thiol self-assembled monolayers by atomic force microscopy. J Vac Sci Technol A 19(4), 1234–1240.CrossRefGoogle Scholar
Mate, CM, McClelland, GM, Erlandsson, R & Chiang, S (1987). Atomic-scale friction of a tungsten tip on a graphite surface. Phys Rev Lett 59(17), 1942–1945.CrossRefGoogle ScholarPubMed
Mo, Y, Turner, KT & Szlufarska, I (2009). Friction laws at the nanoscale. Nature 457(7233), 1116–1119.CrossRefGoogle ScholarPubMed
Nguyen, QD & Chung, KH (2019). Effect of tip shape on nanomechanical properties measurements using AFM. Ultramicroscopy 202, 1–9.CrossRefGoogle ScholarPubMed
Nguyen, QD, Oh, ES & Chung, KH (2019). Nanomechanical properties of polymer binders for Li-ion batteries probed with colloidal probe atomic force microscopy. Polym Test 76, 245–253.CrossRefGoogle Scholar
Pratt, JR, Shaw, GA, Kumanchik, L & Burnham, NA (2010). Quantitative assessment of sample stiffness and sliding friction from force curves in atomic force microscopy. J Appl Phys 107(4), 044305.CrossRefGoogle Scholar
Rabe, U & Arnold, W (1994). Acoustic microscopy by atomic force microscopy. Appl Phys Lett 64(12), 1493–1495.CrossRefGoogle Scholar
Reynaud, C, Sommer, F, Quet, C, El Bounia, N & Duc, TM (2000). Quantitative determination of young's modulus on a biphase polymer system using atomic force microscopy. Surf Interface Anal 30(1), 185–189.3.0.CO;2-D>CrossRefGoogle Scholar
Rundlöf, M, Karlsson, M, Wågberg, L, Poptoshev, E, Rutland, M & Claesson, P (2000). Application of the JKR method to the measurement of adhesion to Langmuir–Blodgett cellulose surfaces. J Colloid Interface Sci 230(2), 441–447.CrossRefGoogle Scholar
Sahin, O, Magonov, S, Su, C, Quate, CF & Solgaard, O (2007). An atomic force microscope tip designed to measure time-varying nanomechanical forces. Nat Nanotechnol 2(8), 507–514.CrossRefGoogle ScholarPubMed
Samsonov, GV (1968). Mechanical properties of the elements. In Handbook of the Physicochemical Properties of the Elements, Samsonov, GV (Ed.), pp. 387–446. Boston, MA: Springer US.CrossRefGoogle Scholar
Savkoor, AR, Briggs, GAD & Tabor, D (1977). The effect of tangential force on the contact of elastic solids in adhesion. Proc R Soc Lond A Math Phys Sci 356(1684), 103–114.Google Scholar
Schwarz, UD, Köster, P & Wiesendanger, R (1996). Quantitative analysis of lateral force microscopy experiments. Rev Sci Instrum 67(7), 2560–2567.CrossRefGoogle Scholar
Stiernstedt, J, Rutland, MW & Attard, P (2005). A novel technique for the in situ calibration and measurement of friction with the atomic force microscope. Rev Sci Instrum 76(8), 083710.CrossRefGoogle Scholar
Stiernstedt, J, Rutland, MW & Attard, P (2006). Erratum: “A novel technique for the in situ calibration and measurement of friction with the atomic force microscope” [Rev. Sci. Instrum. 76, 083710 (2005)]. Rev Sci Instrum 77(1), 019901.CrossRefGoogle Scholar
Sundararajan, S & Bhushan, B (2000). Topography-induced contributions to friction forces measured using an atomic force/friction force microscope. J Appl Phys 88(8), 4825–4831.CrossRefGoogle Scholar
Tran, DK & Chung, KH (2015). Simultaneous measurement of elastic properties and friction characteristics of nanowires using atomic force microscopy. Exp Mech 55(5), 903–915.CrossRefGoogle Scholar
Tran Khac, BC & Chung, KH (2016). Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy. Ultramicroscopy 161, 41–50.CrossRefGoogle ScholarPubMed
Tran-Khac, BC, Kim, HJ, DelRio, FW & Chung, KH (2019). Operational and environmental conditions regulate the frictional behavior of two-dimensional materials. Appl Surf Sci 483, 34–44.CrossRefGoogle ScholarPubMed
Warmack, RJ, Zheng, XY, Thundat, T & Allison, DP (1994). Friction effects in the deflection of atomic force microscope cantilevers. Rev Sci Instrum 65(2), 394–399.CrossRefGoogle Scholar
Supplementary material: File

Huynh et al. supplementary material

Figures S1-S2

Download Huynh et al. supplementary material(File)
File 384.5 KB