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In Situ Electron Microscopy Characterization of Optoelectronic Nanostructures and Nanodevices

Published online by Cambridge University Press:  01 August 2010

M Gao ,
C Li ,
W Li ,
Z Liu  and
L-M Peng
M Gao
Affiliation:
Peking University, China
C Li
Affiliation:
Peking University, China
W Li
Affiliation:
Peking University, China
Z Liu
Affiliation:
Peking University, China
L-M Peng
Affiliation:
Peking University, China

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1758 - 1759
Copyright
Copyright © Microscopy Society of America 2010