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In Situ Electrical Characterization of Single Nanofibers Using a Nanomanipulator in an FIB/SEM Microscope

Published online by Cambridge University Press:  01 August 2010

K Roelofs ,
S Xu ,
G Poirier  and
N Yao
K Roelofs
Affiliation:
Princeton University
S Xu
Affiliation:
Princeton University
G Poirier
Affiliation:
Princeton University
N Yao
Affiliation:
Princeton University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1800 - 1801
Copyright
Copyright © Microscopy Society of America 2010