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In situ Comparative heating and simultaneous multi-detector imaging at high and ultra-low landing energies

Published online by Cambridge University Press:  30 July 2021

Atsushi Muto
Affiliation:
Hitachi High-Tech America, Clarksburg, Maryland, United States
Stas Dogel
Affiliation:
Hitachi High-Tech Canada, Inc., United States
Kotaro Hosoya
Affiliation:
Hitachi High-Tech Canada, Inc., United States
Hooman Hosseinkhannazer
Affiliation:
Norcada, Inc., United States
Najia Mahdi
Affiliation:
Norcada, Inc., United States
Michael T Postek
Affiliation:
University of South Florida, United States

Abstract

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Type
Vendor Symposium
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Postek, M, et al. , Proc. SPIE. 11467(2020) 114670QGoogle Scholar
Hashimoto, Y, et al. , Microsc. Microanal. 25 (Suppl 2) (2019) p.p.564CrossRefGoogle Scholar
Howe, J, et al. , Microsc. Microanal. 23 (Suppl 1) (2017) p.p.66CrossRefGoogle Scholar