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In Situ Biasing of Conductive Bridge Resistive Memory Devices Observed in a Transmission Electron Microscope

Published online by Cambridge University Press:  04 August 2017

Remy Berthier ,
Cécile Nail ,
Catherine Carabasse ,
Gabriel Molas  and
David Cooper
Remy Berthier
Affiliation:
Univ. Grenoble AlpeS, Grenoble, France CEA-LETI, MINATEC CampuS, Grenoble, France
Cécile Nail
Affiliation:
Univ. Grenoble AlpeS, Grenoble, France CEA-LETI, MINATEC CampuS, Grenoble, France
Catherine Carabasse
Affiliation:
Univ. Grenoble AlpeS, Grenoble, France CEA-LETI, MINATEC CampuS, Grenoble, France
Gabriel Molas
Affiliation:
Univ. Grenoble AlpeS, Grenoble, France CEA-LETI, MINATEC CampuS, Grenoble, France
David Cooper
Affiliation:
Univ. Grenoble AlpeS, Grenoble, France CEA-LETI, MINATEC CampuS, Grenoble, France

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1452 - 1453
Copyright
© Microscopy Society of America 2017 

References

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