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Improved SDD Detectors for Ultra-Fast, High-Resolution EDS in Microanalysis

Published online by Cambridge University Press:  09 October 2013

A. Niculae
Affiliation:
M. Bornschlegl
Affiliation:
R. Eckhardt
Affiliation:
J. Herrmann
Affiliation:
S. Jeschke
Affiliation:
G. Krenz
Affiliation:
A. Liebel
Affiliation:
G. Lutz
Affiliation:
H. Soltau
Affiliation:
L. Strüder
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013