Hostname: page-component-848d4c4894-r5zm4 Total loading time: 0 Render date: 2024-06-28T01:43:24.962Z Has data issue: false hasContentIssue false
  • English
  • Français

Improved Pump Down Time with Evactron® Turbo Plasma™ Cleaning

Published online by Cambridge University Press:  04 August 2017

Ewa Kosmowska ,
Michael Cable ,
Barbara Armbruster  and
Ronald Vane
Ewa Kosmowska
Affiliation:
XEI Scientific, Inc., Redwood City, CAUSA.
Michael Cable
Affiliation:
XEI Scientific, Inc., Redwood City, CAUSA.
Barbara Armbruster
Affiliation:
XEI Scientific, Inc., Redwood City, CAUSA.
Ronald Vane
Affiliation:
XEI Scientific, Inc., Redwood City, CAUSA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 74 - 75
Copyright
© Microscopy Society of America 2017 

References

[1] Vane, R. (2013). Microsc. Microanal. 19(2), 1338.CrossRefGoogle Scholar
[2] Kobayashi, H. (2010). J. Phy. So. JPN 53(10), 568–572.Google Scholar