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Implications of Point Defects on the Atomic Structure of Domain Walls in BiFeO3

Published online by Cambridge University Press:  05 August 2019

A. Bencan ,
G. Drazic ,
M. Makarovic ,
H. Ursic ,
M. Komelj  and
T. Rojac
A. Bencan*
Affiliation:
Electronic Ceramics Department, Jozef Stefan Institute, Ljubljana, Slovenia.
G. Drazic
Affiliation:
Department of Materials Chemistry, National Institute of Chemistry, Ljubljana, Slovenia.
M. Makarovic
Affiliation:
Electronic Ceramics Department, Jozef Stefan Institute, Ljubljana, Slovenia. Jozef Stefan International Postgraduate School, 1000 Ljubljana, Slovenia.
H. Ursic
Affiliation:
Electronic Ceramics Department, Jozef Stefan Institute, Ljubljana, Slovenia.
M. Komelj
Affiliation:
Department for Nanostructured Materials, Jozef Stefan Institute, Ljubljana, Slovenia.
T. Rojac
Affiliation:
Electronic Ceramics Department, Jozef Stefan Institute, Ljubljana, Slovenia.
*
*Corresponding author: andreja.bencan@ijs.si

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2346 - 2347
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Seidel, J. et al. , Nat. Mater. 8 (2009), p.229.Google Scholar
[2]Sharma, P. et al. , Sci. Adv. 3 (2017), e1700512.Google Scholar
[3]Catalan, G. et al. , Rev. Mod. Phys. 84 (2012), p.119.Google Scholar
[4]Rojac, T. et al. , Adv. Funct. Mater. 25 (2015), p.2099.Google Scholar
[5]Rojac, T. et al. , Nat. Mat. 16 (2017), p.322.Google Scholar
[6]This work was supported by the Slovenian Research Agency within programs (P2-0105, P2-0393) and projects J2-9253, PR-08298.Google Scholar