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Imaging Uncoated Plant Seeds with In-Lens and Secondary-Electron Detectors in a High-Vacuum Field Emission SEM

Published online by Cambridge University Press:  08 April 2017

D Cisneros
Affiliation:
University of South Carolina
K Ghoshroy
Affiliation:
University of South Carolina
S Ghoshroy
Affiliation:
University of South Carolina

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2011