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Imaging of Single Vacancies and Dopant Complexes in Aluminum Nitride

Published online by Cambridge University Press:  01 August 2018

Tim B. Eldred
Affiliation:
North Carolina State University, Materials Science and Engineering, Raleigh, USA
Joshua S. Harris
Affiliation:
North Carolina State University, Materials Science and Engineering, Raleigh, USA
Jonathon N. Baker
Affiliation:
North Carolina State University, Materials Science and Engineering, Raleigh, USA
Douglas L. Irving
Affiliation:
North Carolina State University, Materials Science and Engineering, Raleigh, USA
James M. LeBeau
Affiliation:
North Carolina State University, Materials Science and Engineering, Raleigh, USA
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Abstract

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© Microscopy Society of America 2018 

References

[1] Chichibu, S.F., Miyake, H. Ishikawa, Y. J. Appl. Phys 113 2013.CrossRefGoogle Scholar
[2] Taniyasu, Y., Kasu, M. Kobayashi, N. Appl. Phys. Lett 81 2002 12551257.CrossRefGoogle Scholar
[3] Uedono, A., Tenjinbayashi, K. Tsutsui, T. J. Appl. Phys 111 2012.Google Scholar
[4] Feng, J., Kvit, A.V. Zhang, C. Microsc. Microanal 22 2016 902903.CrossRefGoogle Scholar
[5] The authors acknowledge funding from AFOSR FA9550-17-1-0225.Google Scholar
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