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Imaging of 2-Dimensional Dislocation Networks in Twisted Bilayer Graphene and Beyond

Published online by Cambridge University Press:  30 July 2020

Rebecca Engelke ,
Hyobin Yoo ,
Stephen Carr ,
Suk Hyun Sung ,
Kuan Zhang ,
Andres Mier Valdivia ,
Ellad Tadmor ,
Robert Hovden ,
Efthimos Kaxiras  and
Philip Kim
Rebecca Engelke
Affiliation:
Harvard University, Somerville, Massachusetts, United States
Hyobin Yoo
Affiliation:
Harvard University, Cambridge, Massachusetts, United States
Stephen Carr
Affiliation:
Harvard University, Cambridge, Massachusetts, United States
Suk Hyun Sung
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Kuan Zhang
Affiliation:
University of Minnesota, Minneapolis, Minnesota, United States
Andres Mier Valdivia
Affiliation:
Harvard University, Cambridge, Massachusetts, United States
Ellad Tadmor
Affiliation:
University of Minnesota, Minneapolis, Minnesota, United States
Robert Hovden
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Efthimos Kaxiras
Affiliation:
Harvard University, Cambridge, Massachusetts, United States
Philip Kim
Affiliation:
Harvard University, Cambridge, Massachusetts, United States

Abstract

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Type
New Frontiers in Electron Microscopy of Two-dimensional Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 854 - 855
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Copyright
Copyright © Microscopy Society of America 2020

References

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