Imaging Analytical Studies of Old Master Paints Using FTIR, SIMS and SEMEDX of Embedded Paint Cross Sections

J Boon; E S B Ferreira; K Keune

doi:10.1017/S143192760550744X

Imaging Analytical Studies of Old Master Paints Using FTIR, SIMS and SEMEDX of Embedded Paint Cross Sections

Published online by Cambridge University Press: 01 August 2005

J Boon ,

E S B Ferreira and

K Keune

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J Boon: Affiliation:
FOM Institute AMOLF, The Netherlands
E S B Ferreira: Affiliation:
FOM Institute AMOLF, The Netherlands
K Keune: Affiliation:
FOM Institute AMOLF, The Netherlands

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type: Research Article
Information: Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1370 - 1371

DOI: https://doi.org/10.1017/S143192760550744X [Opens in a new window]

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Imaging Analytical Studies of Old Master Paints Using FTIR, SIMS and SEMEDX of Embedded Paint Cross Sections

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