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Image-based 3D Nanocrystallography by Means of Tilt Protocol/Lattice-Fringe Fingerprinting with Contemporary Side-entry Specimen Goniometers

Published online by Cambridge University Press:  01 August 2005

P Moeck ,
B Seipel ,
W Qin ,
E Mandell  and
P Fraundorf
P Moeck
Affiliation:
Portland State University, Portland, Oregon
B Seipel
Affiliation:
Portland State University, Portland, Oregon
W Qin
Affiliation:
Freescale Semiconductor, Chandler, Arizona
E Mandell
Affiliation:
University of Missouri St. Louis, St. Louis, Missouri
P Fraundorf
Affiliation:
University of Missouri St. Louis, St. Louis, Missouri

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 632 - 633
Copyright
© 2005 Microscopy Society of America