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Image Calculations vs. Experimental Micrographs

Published online by Cambridge University Press:  01 August 2018

Tore Niermann
Tore Niermann*
Affiliation:
Technische Universitat Berlin, Institut fur Optik und Atomare Physik, Berlin, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 568 - 569
Copyright
© Microscopy Society of America 2018 

References

[1] de Graef, M. Introduction to Conventional Transmission Electron Microscopy. Cambridge University Press Cambridge 2003.Google Scholar
[2] Haider, M., et al, Microsc. Microanal. 16 2010) p. 393.Google Scholar
[3] Thust, A. Physical Review Letters 102 2009) p. 220801.Google Scholar
[4] Mobus, G. In High-Resolution Imaging and Spectrometry of Materials (eds F. Ernst and M. Ruhle Springer-Verlag Berlin, Heidelberg 2003) p. 69.Google Scholar
[5] The author acknowledges financial support from the Deutsche Forschungsgemeinschaft (SFB 787).Google Scholar