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Identifying and Engineering the Stacking Sequence in CVD Grown Few-layer MoS2 via Aberration-corrected STEM

Published online by Cambridge University Press:  04 August 2017

Aiming Yan ,
Wei Chen ,
Colin Ophus ,
Jim Ciston ,
Christian Humberto Merino  and
Alex Zettl
Aiming Yan
Affiliation:
Department of Physics, University of California, Berkeley, Berkley, CA, USA. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkley, CA, USA.
Wei Chen
Affiliation:
Department of Mechanical, Materials and Aerospace Engineering, Illinois Institute of Technology, Chicago, IL, USA.
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
Jim Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
Christian Humberto Merino
Affiliation:
Department of Physics, University of California, Berkeley, Berkley, CA, USA.
Alex Zettl
Affiliation:
Department of Physics, University of California, Berkeley, Berkley, CA, USA. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkley, CA, USA. Kavli Energy NanoSciences Institute at the University of California, Berkeley and the Lawrence Berkeley National Laboratory, Berkeley, CA, USA.

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2006 - 2007
Copyright
© Microscopy Society of America 2017 

References

[1] Najmaei, S., et al, Nat. Mater 12 2013). p. 754.Google Scholar
[2] van der Zande, A. M., et al, Nat. Mater 12 2013). p. 554.Google Scholar
[3] Komsa, H. P., et al, Phys. Rev. Lett 109 2012). p. 035503.Google Scholar
[4] Yan, A., et al, Physical Review B 93 2016). p. 41420.Google Scholar