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Identification of interfacial defects in the layered structure of a chalcopyrite compound
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Defects in Materials: How We See and Understand Them
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
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The authors acknowledge the use of Princeton's Imaging and Analysis Center (IAC), which is partially supported by the Princeton Center for Complex Materials (PCCM), a National Science Foundation (NSF) Materials Research Science and Engineering Center (MRSEC; DMR-2011750).Google Scholar