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History of JEOL Microbeam Analysis: High Accuracy Analyses for Scientific and Industrial Work from the Centimeter to Nanometer Scale
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1018 - 1019
- Copyright
- © Microscopy Society of America 2017
References
[1] “Souzou to Kaihatsu” (Japanese), Creation and Development in JEOL Ltd. 60 Year Anniversary” (2010).Google Scholar
[2]
Reed, J. B. “Electron Microprobe Analysis second edition”, (Cambridge University Press).Google Scholar