High Resolution TEM and Electron Diffraction Study of Graphene Layers

Y Suh; S Park; M Kim

doi:10.1017/S1431927609098808

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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High Resolution TEM and Electron Diffraction Study of Graphene Layers

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