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High Resolution Imaging of Short-Range Order Materials (Allophane) with Aberration Corrected TEM and Direct Electron Detection

Published online by Cambridge University Press:  04 August 2017

Thomas G. Sharp  and
Shery L.Y. Chang
Thomas G. Sharp
Affiliation:
School of Earth and Space Exploration, Arizona State University, Tempe AZ, USA LeRoy Eyring Center For Solid State Science, Arizona State University, Tempe AZ, USA
Shery L.Y. Chang
Affiliation:
LeRoy Eyring Center For Solid State Science, Arizona State University, Tempe AZ, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2152 - 2153
Copyright
© Microscopy Society of America 2017 

References

[1] Coleman, S. M. U.S. Geological Survey Professional Paper 1246 1981). p. 51.Google Scholar
[2] Michalski, J. R., et al, Icarus 174 2004). p. 161.Google Scholar
[3] Rampe, E. B., et al, Geology 2012). p. 995.Google Scholar