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High Resolution 20kV Transmission Electron Microscopy of Nanosystems – First Results Towards Sub Ångstrøm Low Voltage EM (SALVE – Microscopy)

Published online by Cambridge University Press:  01 August 2010

U Kaiser ,
J Meyer ,
J Biskupek ,
J Leschner ,
AN Khlobystov ,
H Müller ,
P Hartel ,
M Haider ,
S Eyhusen  and
G Benner
U Kaiser
Affiliation:
University of Ulm, Germany
J Meyer
Affiliation:
University of Ulm, Germany
J Biskupek
Affiliation:
University of Ulm, Germany
J Leschner
Affiliation:
University of Ulm, Germany
AN Khlobystov
Affiliation:
University of Nottingham, United Kingdom
H Müller
Affiliation:
Corrected Electron Optical Systems GmbH, Germany
P Hartel
Affiliation:
Corrected Electron Optical Systems GmbH, Germany
M Haider
Affiliation:
Corrected Electron Optical Systems GmbH, Germany
S Eyhusen
Affiliation:
Carl Zeiss NTS GmbH, Germany
G Benner
Affiliation:
Carl Zeiss NTS GmbH, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1702 - 1703
Copyright
Copyright © Microscopy Society of America 2010