Hostname: page-component-848d4c4894-ttngx Total loading time: 0 Render date: 2024-05-01T21:46:04.812Z Has data issue: false hasContentIssue false
  • English
  • Français

High Performance in Low Voltage HR-STEM Applications Enabled By Fast Automatic Tuning of the Combination of a Monochromator and Probe Cs-Corrector

Published online by Cambridge University Press:  25 July 2016

Sorin Lazar ,
Peter Tiemeijer ,
Sander Henstra ,
Terry Dennemans ,
Jan Ringnalda  and
Bert Freitag
Sorin Lazar
Affiliation:
FEI Company, P.O. Box 80066, KA 5600 Eindhoven, The Netherlands
Peter Tiemeijer
Affiliation:
FEI Company, P.O. Box 80066, KA 5600 Eindhoven, The Netherlands
Sander Henstra
Affiliation:
FEI Company, P.O. Box 80066, KA 5600 Eindhoven, The Netherlands
Terry Dennemans
Affiliation:
FEI Company, P.O. Box 80066, KA 5600 Eindhoven, The Netherlands
Jan Ringnalda
Affiliation:
FEI Company, P.O. Box 80066, KA 5600 Eindhoven, The Netherlands
Bert Freitag
Affiliation:
FEI Company, P.O. Box 80066, KA 5600 Eindhoven, The Netherlands

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 980 - 981
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Haider, M, et al., Nature 392 (1998) 768.CrossRefGoogle Scholar
[2] Krivanek, OL, Dellby, N & Lupini, AR Ultramicroscopy 78 (1999) 1.CrossRefGoogle Scholar
[3] Barthel, J, Houben, L & Tillmann, K Journal of large-scale research facilities 1 (2015) A34.Google Scholar
[4] Tiemeijer, PC, et al., Ultramicroscopy 114 (2012) 72.CrossRefGoogle Scholar
[5] Müller, H, et al., Microscopy and Microanalysis 12 (2006) 442.Google Scholar