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Helium Ion Microscopy Imaging of Bottlebrush Copolymers

Published online by Cambridge University Press:  05 August 2019

Nikolay Borodinov
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
Dongsook Chang
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
Artem Trofimov
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
Kunlun Hong
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
Bobby Sumpter
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
Olga S. Ovchinnikova
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
Alex Belianinov*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
*
*Corresponding author: belianinova@ornl.gov

Abstract

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Type
Advances in Focused Ion Beam Instrumentation and Techniques
Copyright
Copyright © Microscopy Society of America 2019 

References

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[7]This research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility.Google Scholar