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Grain Boundary Studies in CuInGaSe2 Using EBSD in the Dual Beam FIB

Published online by Cambridge University Press:  01 August 2005

B P Gorman ,
M J Kaufman ,
M M Nowell ,
S Yoon  and
T Anderson
B P Gorman
Affiliation:
University of North Texas
M J Kaufman
Affiliation:
University of North Texas
M M Nowell
Affiliation:
TSL/EDAX Inc., Draper, Utah
S Yoon
Affiliation:
University of Florida
T Anderson
Affiliation:
University of Florida

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 508 - 509
Copyright
© 2005 Microscopy Society of America