Hostname: page-component-77c89778f8-sh8wx Total loading time: 0 Render date: 2024-07-19T05:32:48.877Z Has data issue: false hasContentIssue false

The Golden Age of Microanalysis.

Published online by Cambridge University Press:  02 July 2020

Get access

Extract

The main initial source of information in the USA concerning the electron probe was a meeting at the Naval Research Laboratories in February 1958, followed in 1960 by a summer school at MIT organized by Prof. Norton and R. Ogilvie. Further visits to the USA and publications in English by the inventor of the instrument, R. Castaing, also contributed to the attention given here to the new technique. Since numerous research laboratories in the USA were keenly interested in the new device, the development of instruments and the contributions to its use were considerable. The relatively small number of active researchers in the field rendered personal connections and cooperation possible and attractive.

Before the availability of American-made commercial microprobes, many investigators built their own instruments. Most of them were not trained as instrument builders, and the usefulness of the resulting devices was somewhat limited. These improvisations in instrument construction ceased once commercial microprobe manufacturers entered the field. Yet, in the process, much was learned and the American investigators contributed significantly to the theory of microanalysis. We realized that, with the limited calculation facilities then available, the complex interactions leading to the x-ray signal had to be treated in simplified ways, and we described ‘approximations’ rather than ‘laws’ in our efforts to understand and quantitatively describe the physical facts. We also came to realize that even where the physical processes were well known, we often lacked the knowledge of the physical parameters required for quantitation and the effect of their uncertainties on the accuracy of the analytical results. Another area in which advances were needed, and soon achieved, was the application of the technique to a wide range of technical and scientific problems. The interaction between manufacturers and users greatly stimulated improvements in the instrument design.

Type
MAS Celebrates: Fifty Years of Electron Probe Microanalysis
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Castaing, R., Electron Probe Microanalysis, Advances in Electronics and Electron Physics, Marton, L., ed., New YorkAcademic Press, (1960) 317386.Google Scholar
2.Birks, L. S., Electron Probe Microanalysis. 2d. ed., New York Wiley, J. (1971).Google Scholar
3.Ziebold, O. T. and Ogilvie, R. E, Analytical Chemistry 46 (1964) 81.Google Scholar
4.Bence, A. E. and Albee, A. L., J. Geology 76 (1968) 382.CrossRefGoogle Scholar
5.McKinley, T. D.et al., eds, The Electron Microprobe, New York Wiley, J. (1966).Google Scholar
6.Pattee, H. H.et al., eds, X-Ray Optics and X-Ray Microanalysis, New YorkAcademic Press (1963).Google Scholar
7.Dolby, R. M., ibid., 483497.Google Scholar
8.Heinrich, K. F. J., Mass Absorption Coefficients for Electron Probe Microanalysis, in X-Ray Optics and Microanalysis, Proc. ICXOM 11, Brown, J. and Packwood, R. H., eds., London, Canada (1986) 67119.Google Scholar
9.Heinrich, K. F. J., Scanning Electron Probe Microanalysis, in Optical and Electron Microscopy, Vol.6, Barer, R. and Cosslett, V. E., eds, LondonAcademic Press (1975) 225299.Google Scholar
10.Heinrich, K. F. J., ed., Quantitative Electron Probe Microanalysis, NBS. Spec. Publ. 298, Washington (1968).Google Scholar
11.Heinrich, K. F. J. and Newbury, D. E., eds., Electron Probe Quantitation, New YorkPlenum Press(1991).CrossRefGoogle Scholar
12.Heinrich, K. F. J., ed., Characterization of Particles, NBS Spec. Publ.533, Washington (1980).CrossRefGoogle Scholar
13.Heinrich, K. F. J.et al., eds., Energy Dispersive X-Ray Spectrometry, NBS Spec. Publ. 604, Washington (1981).CrossRefGoogle Scholar