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Full-field X-ray Nano-scope Developed at SSRF

Published online by Cambridge University Press:  01 August 2018

Biao Deng ,
Yudan ,
Yuqi Ren Wang ,
Tianxi Sun ,
Guangzhao ,
Zhou Guohao Du ,
Fen Tao ,
Honglan Xie  and
Tiqiao Xiao
Biao Deng
Affiliation:
Shanghai Institute of Applied Physics, CAS, Shanghai, China
Yudan
Affiliation:
Shanghai Institute of Applied Physics, CAS, Shanghai, China
Yuqi Ren Wang
Affiliation:
Shanghai Institute of Applied Physics, CAS, Shanghai, China
Tianxi Sun
Affiliation:
Beijing Normal University, Beijing, China
Guangzhao
Affiliation:
Shanghai Institute of Applied Physics, CAS, Shanghai, China
Zhou Guohao Du
Affiliation:
Shanghai Institute of Applied Physics, CAS, Shanghai, China
Fen Tao
Affiliation:
Shanghai Institute of Applied Physics, CAS, Shanghai, China
Honglan Xie
Affiliation:
Shanghai Institute of Applied Physics, CAS, Shanghai, China
Tiqiao Xiao
Affiliation:
Shanghai Institute of Applied Physics, CAS, Shanghai, China

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1012 - 1013
Copyright
© Microscopy Society of America 2018 

References

[1] Deng, Biao, et al., SPIE 8851 2013) p. 88511D–1.Google Scholar
[2] Feng, Binggang, et al., CHINESE OPTICS LETTERS 14 2016) p. 093401.Google Scholar
[3] Wang, Yudan, Ren, Yuqi, Zhou, Guangzhao, et al (submitted).Google Scholar
[4] Tao, Fen, Wang, Yudan, Ren, Yuqi, et al., ACTAOPTICASINICA 37 2017) p. 0034002.Google Scholar
[5] Jiang, Bowen, Liu, Zhiluo, Sun, Xuepeng, et al., Optics Communications 398 2017) p. 91.Google Scholar